3IYF
Atomic Model of the Lidless Mm-cpn in the Open State
ELECTRON MICROSCOPY
Sample |
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Lidless Mm-cpn |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK I |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | |
Reported Resolution (Å) | 8 |
Resolution Method | FSC 0.5 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | D8 |
Map-Model Fitting and Refinement | |||||
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Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | |||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | GATAN ULTRASCAN 4000 (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 20 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | 100 |
Microscope Model | JEOL 3200FSC |
Minimum Defocus (nm) | 1000 |
Maximum Defocus (nm) | 3000 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 4.1 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | JEOL 3200FSC CRYOHOLDER |
Nominal Magnification | 80000 |
Calibrated Magnification | 112000 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
RECONSTRUCTION | EMAN |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
Each micrograph |