1ZXQ
THE CRYSTAL STRUCTURE OF ICAM-2
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
---|---|---|---|---|
ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 6.4 | 277 | CRYSTALS WERE BEST GROWN AT 4C USING THE HANGING-DROP VAPOR DIFFUSION METHOD, WITH A PROTEIN SOLUTION OF 15-17 MG/ML AND A CRYSTALLIZATION SOLUTION WITH 20% PEG 4000, 20 MM CACODYLATE BUFFER PH 6.4, AND 25 MM B-OCTYL-GLUCOPYRANOSIDE., vapor diffusion - hanging drop, temperature 277K |
Crystal Properties | |
---|---|
Matthews coefficient | Solvent content |
3.56 | 45 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 69 | α = 90 |
b = 63.7 | β = 114.5 |
c = 76.2 | γ = 90 |
Symmetry | |
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Space Group | C 1 2 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 113 | AREA DETECTOR | SIEMENS | 1995-04-20 | M |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 |
Data Collection
Overall | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 2.2 | 100 | 93.9 | 0.44 | 10.5 | 3.1 | 14277 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1 | 2.2 | 2.32 | 68.8 | 0.141 | 4.2 | 1.6 |
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | Mean Isotropic B | |||||||||
X-RAY DIFFRACTION | MIR | 2.2 | 15 | 2 | 88.3 | 0.226 | 0.226 | 0.295 | 50 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
12.8 | 10.9 | 17.4 | 26.7 |
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
x_scangle_it | 2.5 |
x_angle_deg | 2.2 |
x_mcangle_it | 2 |
x_scbond_it | 2 |
x_mcbond_it | 1.5 |
x_bond_d | 0.019 |
x_bond_d_na | |
x_bond_d_prot | |
x_angle_d | |
x_angle_d_na |
Non-Hydrogen Atoms Used in Refinement | |
---|---|
Non-Hydrogen Atoms | Number |
Protein Atoms | 1500 |
Nucleic Acid Atoms | |
Solvent Atoms | 142 |
Heterogen Atoms | 168 |
Software
Software | |
---|---|
Software Name | Purpose |
XDS | data scaling |
CCP4 | data reduction |
X-PLOR | model building |
X-PLOR | refinement |
XDS | data reduction |
CCP4 | data scaling |
X-PLOR | phasing |