4ANW
Complexes of PI3Kgamma with isoform selective inhibitors.
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
---|---|---|---|---|
ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 292 | CRYSTALS WERE GROWN AT 19C IN HANGING DROPS USING VAPOR DIFFUSION. THE COMPLEX WAS FORMED BY INCUBATING 49.5UL OF PI3KG-HIS6 (7.2 MG/ML IN 20 MM TRIS-HCL, PH 7.2, 50 MM (NH4)2SO4, AND 1 MM TCEP) WITH 0.5UL OF LIGAND (100 MM STOCK IN 100% DMSO) FOR 30 MINUTES AT 4C. CRYSTALS OF THE BINARY COMPLEX WERE OBTAINED BY MIXING 1.0UL OF THE PI3KG:INHIBITOR COMPLEX WITH 1.0UL OF A RESERVOIR SOLUTION CONSISTING OF 16-21% PEG 4K, 0.25 M (NH4)2SO4, AND 0.1 M TRIS-HCL, PH 7.5. |
Crystal Properties | |
---|---|
Matthews coefficient | Solvent content |
2.32 | 47 |
Crystal Data
Unit Cell | |
---|---|
Length ( Å ) | Angle ( ˚ ) |
a = 143.424 | α = 90 |
b = 68.531 | β = 95.26 |
c = 106.263 | γ = 90 |
Symmetry | |
---|---|
Space Group | C 1 2 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 155 | CCD | ADSC CCD | 2010-08-24 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | APS BEAMLINE 21-ID-F | APS | 21-ID-F |
Data Collection
Overall | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 2.31 | 71.4 | 99.2 | 0.06 | 15.1 | 3.7 | 44953 | -3 | 67.6 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1 | 2.31 | 2.59 | 99.4 | 0.85 | 1.86 | 3.8 |
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | ||||||
X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | IN-HOUSE PI3KG STRUCTURE | 2.31 | 71.43 | 42360 | 2248 | 99.25 | 0.238 | 0.235 | 0.296 | RANDOM |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
57.34 |
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_dihedral_angle_2_deg | 36.725 |
r_dihedral_angle_3_deg | 21.375 |
r_dihedral_angle_4_deg | 16.697 |
r_dihedral_angle_1_deg | 8.22 |
r_angle_refined_deg | 1.831 |
r_chiral_restr | 0.109 |
r_bond_refined_d | 0.019 |
r_gen_planes_refined | 0.001 |
r_bond_other_d | |
r_angle_other_deg |
Non-Hydrogen Atoms Used in Refinement | |
---|---|
Non-Hydrogen Atoms | Number |
Protein Atoms | 6757 |
Nucleic Acid Atoms | |
Solvent Atoms | 66 |
Heterogen Atoms | 35 |
Software
Software | |
---|---|
Software Name | Purpose |
REFMAC | refinement |
XDS | data reduction |
XSCALE | data scaling |
PHASER | phasing |