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Structure of Arp4-Ies4-N-actin-Arp8-Ino80HSA subcomplex (A-module) of Chaetomium thermophilum INO80 on straight DNA
Refinement RMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 39.092 r_long_range_B_other 39.092 r_scangle_other 28.436 r_mcangle_it 20.849 r_mcangle_other 20.847 r_scbond_it 17.494 r_scbond_other 17.492 r_dihedral_angle_3_deg 14.014 r_mcbond_it 13.964 r_mcbond_other 13.964
RMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 39.092 r_long_range_B_other 39.092 r_scangle_other 28.436 r_mcangle_it 20.849 r_mcangle_other 20.847 r_scbond_it 17.494 r_scbond_other 17.492 r_dihedral_angle_3_deg 14.014 r_mcbond_it 13.964 r_mcbond_other 13.964 r_dihedral_angle_2_deg 10.655 r_dihedral_angle_1_deg 7.352 r_angle_refined_deg 1.72 r_angle_other_deg 0.525 r_chiral_restr 0.095 r_gen_planes_refined 0.009 r_bond_refined_d 0.008 r_gen_planes_other 0.001 r_bond_other_d r_dihedral_angle_4_deg r_nbd_refined r_nbd_other r_nbtor_refined r_nbtor_other r_xyhbond_nbd_refined r_xyhbond_nbd_other r_metal_ion_refined r_metal_ion_other r_symmetry_vdw_refined r_symmetry_vdw_other r_symmetry_hbond_refined r_symmetry_hbond_other r_symmetry_metal_ion_refined r_symmetry_metal_ion_other r_scangle_it r_rigid_bond_restr r_sphericity_free r_sphericity_bonded
Sample INO80 A-Module (Arp4-Ies4-N-actin-Arp8-Ino80HSA) on straight DNA Sample Components INO80 A-Module (Arp4-Ies4-N-actin-Arp8-Ino80HSA) DNA
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 97000 Reported Resolution (Å) 3.3 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 42.4
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TITAN KRIOS Minimum Defocus (nm) 1100 Maximum Defocus (nm) 2900 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION