X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
17.9100 MM HEPES PH 7.5 30% PEG 4000 200 MM CACL2
Crystal Properties
Matthews coefficientSolvent content
3.766.7

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 70.6α = 79.3
b = 77β = 73.4
c = 103.9γ = 74.3
Symmetry
Space GroupP 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100CCDMARRESEARCH2004-08-12MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSLS BEAMLINE X06SASLSX06SA

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.31590.60.17.562.982407774.2

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-Work (Depositor)R-Free (Depositor)R-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONOTHERTHROUGHOUT2.314.987998442101000.2260.2240.269RANDOM56.6
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
2.98-1.846.91-1.36-1.79-3.91
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg39.005
r_dihedral_angle_4_deg23.706
r_dihedral_angle_3_deg21.491
r_dihedral_angle_1_deg11.575
r_scangle_it5.962
r_mcangle_it4.651
r_scbond_it4.358
r_mcbond_it3.194
r_angle_refined_deg2.504
r_nbtor_refined0.341
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms9192
Nucleic Acid Atoms
Solvent Atoms460
Heterogen Atoms2476

Software

Software
Software NamePurpose
REFMACrefinement
XDSdata reduction
XSCALEdata scaling