6OEU

Structure of human Patched1


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg34.258
r_dihedral_angle_3_deg16.881
r_long_range_B_refined13.268
r_long_range_B_other13.268
r_dihedral_angle_4_deg12.707
r_mcangle_it8.64
r_mcangle_other8.639
r_dihedral_angle_1_deg7.497
r_scangle_other6.463
r_mcbond_it5
Sample
Ptc
Specimen Preparation
Sample Aggregation StatePARTICLE
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles789118
Reported Resolution (Å)3.5
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)1.6
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDARK FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE