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Cryo-EM structure of CARD8-CARD filament
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 4IKM
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 42.086 f_angle_d 0.792 f_chiral_restr 0.047 f_bond_d 0.009 f_plane_restr 0.003
Sample CARD8-CARD filament
Specimen Preparation Sample Aggregation State FILAMENT Vitrification Instrument FEI VITROBOT MARK III Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method HELICAL Number of Particles 111333 Reported Resolution (Å) 3.54 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type HELICAL Axial Symmetry C1 Axial Rise 5.2 Angular Rotation -99.07
Map-Model Fitting and Refinement Id 1 (4IKM) Refinement Space Refinement Protocol RIGID BODY FIT Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type FEI FALCON III (4k x 4k) Electron Dose (electrons/Å**2) 40
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TITAN KRIOS Minimum Defocus (nm) -800 Maximum Defocus (nm) -2200 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS 2.7 Imaging Mode BRIGHT FIELD Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER Nominal Magnification 96000 Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version PARTICLE SELECTION RELION 3.1 IMAGE ACQUISITION SerialEM CTF CORRECTION CTFFIND 4.1 MODEL FITTING PHENIX MODEL REFINEMENT PHENIX MODEL REFINEMENT REFMAC RECONSTRUCTION RELION 3.1
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION 287568