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Multi-Hit SFX using MHz XFEL sources- first hit
Serial Crystallography (SX)
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 6FTR
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 BATCH MODE 3.5 293 NaCl, ethylene glycol, PEG 3350, acetate buffer pH 3.5
Crystal Properties Matthews coefficient Solvent content 2.07 40.56
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 79.3 α = 90 b = 79.3 β = 90 c = 37.73 γ = 90
Symmetry Space Group P 43 21 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 293 PIXEL AGIPD 2017-09-14 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 FREE ELECTRON LASER EUROPEAN XFEL BEAMLINE SPB/SFX 1.3332 European XFEL SPB/SFX
Serial Crystallography Sample delivery method Diffraction ID Description Sample Delivery Method 1 injection
Injection Diffraction ID Description Flow Rate Injector Diameter Injection Power Injector Nozzle Filter Size Carrier Solvent 1 GDVN undefined (µl/min) undefined (µm)
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 3.2 35.49 93.6 0.412 4.36 4.55 2072
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 3.2 3.28 90.79 0.638
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Starting model Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 6FTR 3.202 35.489 2057 207 93.585 0.325 0.3138 0.3157 0.4262 0.4267 10.88
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] -0.374 -0.374 0.748
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 35.657 r_dihedral_angle_3_deg 16.782 r_dihedral_angle_4_deg 15.237 r_dihedral_angle_1_deg 7.569 r_angle_refined_deg 1.447 r_angle_other_deg 1.223 r_rigid_bond_restr 1.166 r_lrange_it 0.889 r_lrange_other 0.889 r_mcangle_other 0.582
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 35.657 r_dihedral_angle_3_deg 16.782 r_dihedral_angle_4_deg 15.237 r_dihedral_angle_1_deg 7.569 r_angle_refined_deg 1.447 r_angle_other_deg 1.223 r_rigid_bond_restr 1.166 r_lrange_it 0.889 r_lrange_other 0.889 r_mcangle_other 0.582 r_mcangle_it 0.581 r_scangle_it 0.501 r_scangle_other 0.501 r_mcbond_it 0.403 r_mcbond_other 0.39 r_scbond_other 0.36 r_scbond_it 0.358 r_nbd_other 0.317 r_symmetry_xyhbond_nbd_refined 0.274 r_symmetry_nbd_refined 0.226 r_nbd_refined 0.221 r_symmetry_nbd_other 0.216 r_nbtor_refined 0.16 r_xyhbond_nbd_refined 0.142 r_symmetry_nbtor_other 0.075 r_chiral_restr 0.063 r_symmetry_xyhbond_nbd_other 0.037 r_bond_refined_d 0.005 r_bond_other_d 0.005 r_gen_planes_refined 0.005 r_gen_planes_other 0.002
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1001 Nucleic Acid Atoms Solvent Atoms 3 Heterogen Atoms 5
Software Software Software Name Purpose REFMAC refinement CrystFEL data reduction Aimless data scaling PHASER phasing