X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION296Mb(H64G,V68A) at 2.5 mM in 20 mM Tris-HCl pH 8.4, 1 mM EDTA, was mixed with an equal volume of reservoir solution (200 mM Tris-HCl pH 8.9 and 2.4 M ammonium sulfate) to perform hanging-drop vapor diffusion crystallization. A crystal was transferred from the drop it was grown in to another 4 uL drop containing well solution with the addition of 10% glycerol. The drop was overlaid with 4 uL mineral oil. A micropipette tip was dipped in sodium dithionite powder and the tip was then slowly submerged into the drop to allow the dithionite crystals to be released. 1 uL of benzyl diazoketone at 500 mM (dissolved in isopropanol) was then added to the drop for a final concentration of 100 mM, then incubated for an additional 22.5 minutes. The crystal was then looped and flash-frozen in liquid nitrogen.
Crystal Properties
Matthews coefficientSolvent content
3.1360.67

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 90.701α = 90
b = 90.701β = 90
c = 45.451γ = 120
Symmetry
Space GroupP 6

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS PILATUS 6M2020-07-14MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONSSRL BEAMLINE BL9-20.9795SSRLBL9-2

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rpim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.439.341000.0690.016127.220.24217516.52
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rpim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
11.41.421.7420.3980.7142

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodStarting modelResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeMean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTFREE R-VALUE6M8F1.439.341.3442172211999.980.15310.15170.178124.52
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d28.0441
f_angle_d1.0218
f_chiral_restr0.0715
f_bond_d0.0098
f_plane_restr0.009
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms1183
Nucleic Acid Atoms
Solvent Atoms223
Heterogen Atoms73

Software

Software
Software NamePurpose
PHENIXrefinement
XDSdata reduction
Aimlessdata scaling
PHENIXphasing