8PZ2

Wait Complex: Lateral open BAM bound Extended SurA


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 5LJO 
experimental modelPDB 1M5Y 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d4.994
f_angle_d0.671
f_chiral_restr0.048
f_bond_d0.006
f_plane_restr0.005
Sample
Wait Complex: Lateral open BAM bound Extended SurA
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles60508
Reported Resolution (Å)4.2
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1 (5LJO, 1M5Y)
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement TargetCross-correlation coefficient
Overall B Value156
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å**2)37.9
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)900
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification165000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcrYOLO
IMAGE ACQUISITIONEPU
CTF CORRECTIONCTFFIND
MODEL FITTINGUCSF ChimeraX
MODEL FITTINGMDFF
MODEL REFINEMENTPHENIX1.19.2_4158:000
INITIAL EULER ASSIGNMENTRELION4.0
FINAL EULER ASSIGNMENTRELION4.0
RECONSTRUCTIONRELION4.0
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION662586