UDP-Glucose-bound UgtP with deletion of Pro48-Met91 and insertion of a Ser-Ser-Ser linker


X-RAY DIFFRACTION

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
in silico modelAlphaFold 

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, SITTING DROP62930.1 M MES, 5% (w/v) PEG6000
Crystal Properties
Matthews coefficientSolvent content
2.8156.27

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 131.12α = 90
b = 64.08β = 107.234
c = 110.66γ = 90
Symmetry
Space GroupC 1 2 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS EIGER X 4M2024-05-22MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONPHOTON FACTORY BEAMLINE BL-1A1.018Photon FactoryBL-1A

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)Rrim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
13.75099.40.2450.9895.493.69535
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)Rrim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
13.73.998.71.1530.6121.453.55

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (All)R-Work (Depositor)R-Work (DCC)R-Free (Depositor)R-Free (DCC)Mean Isotropic B
X-RAY DIFFRACTIONMOLECULAR REPLACEMENTFREE R-VALUE3.748.045953547799.520.2340.230.22990.31050.3249129.425
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
-0.653-0.21-0.9861.483
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg37.262
r_lrange_it25.224
r_dihedral_angle_3_deg23.165
r_dihedral_angle_4_deg15.22
r_scangle_it13.823
r_mcangle_it13.335
r_scbond_it8.14
r_mcbond_it7.923
r_dihedral_angle_1_deg7.738
r_angle_refined_deg1.671
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg37.262
r_lrange_it25.224
r_dihedral_angle_3_deg23.165
r_dihedral_angle_4_deg15.22
r_scangle_it13.823
r_mcangle_it13.335
r_scbond_it8.14
r_mcbond_it7.923
r_dihedral_angle_1_deg7.738
r_angle_refined_deg1.671
r_nbtor_refined0.327
r_symmetry_nbd_refined0.276
r_nbd_refined0.271
r_xyhbond_nbd_refined0.19
r_ncsr_local_group_10.189
r_chiral_restr0.132
r_ext_dist_refined_d0.112
r_symmetry_xyhbond_nbd_refined0.072
r_gen_planes_refined0.007
r_bond_refined_d0.006
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms5129
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms72

Software

Software
Software NamePurpose
REFMACrefinement
XDSdata reduction
XSCALEdata scaling
MOLREPphasing