8DFP

Ectodomain of full-length KIT(DupA502,Y503)-SCF dimers


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d15.484
f_angle_d0.881
f_chiral_restr0.07
f_plane_restr0.009
f_bond_d0.003
Sample
Full-length KIT(DupA502,Y503)-SCF dimers reconstituted in amphipol
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentGATAN CRYOPLUNGE 3
Cryogen NameETHANE
Sample Vitrification DetailsBlotting time 3 sec, blotting force 0.
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles865760
Reported Resolution (Å)3.17
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1 (8DFM)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Target
Overall B Value119.4
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)64.52
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)1200
Maximum Defocus (nm)2200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification64000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging DetailsSerialEM COMA-FREE ALIGNMENT
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC3.2.0
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONcryoSPARC3.2.0
MODEL FITTINGISOLDE1.0b3
INITIAL EULER ASSIGNMENTcryoSPARC3.2.0
FINAL EULER ASSIGNMENTcryoSPARC3.2.0
CLASSIFICATIONcryoSPARC3.2.0
RECONSTRUCTIONcryoSPARC3.2.0
MODEL REFINEMENTPHENIX1.02.1-4487-000
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION3649954